Book Review: EMC Analysis Methods and Computational Models by F.M. Tesche, M.V. Ivanov and T. Karlsson, Wiley, New York, 1997. No. of pages: 623. Price £70
A. R. Overman and R. V. Scholtz III.: Mathematical Models of Crop Growth and Yield. Marcel Dekker, 270 Madison Avenue, New York, NY 10016. 2002. Hardcover, 344 pp., 150.00. ISBN 0-8247-0825-3.